Introduction to Focused Ion Beam Nanometrology
David C. Cox
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
- Imprint: IOP Concise Physics
- Format: Paperback
- ISBN: 9781681740201
- Publication Date: Oct 2015
- Availability: In Stock - Despatched Within 5 Working Days
Nanometrology Using the Transmission Electron Microscope
Vlad Stolojan
- Imprint: IOP Concise Physics
- Format: Paperback
- ISBN: 9781681740560
- Publication Date: Oct 2015
- Availability: In Stock - Despatched Within 5 Working Days
Introduction to Focused Ion Beam Nanometrology
David C. Cox
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
- Imprint: IOP Concise Physics
- Format: Hardback
- ISBN: 9781643278469
- Publication Date: Oct 2015
- Availability: In Stock - Despatched Within 5 Working Days