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Nanometrology Using Transmission Electron Microscopy

Vlad Stolojan (author)

ISBN: 9781681740560

Publication Date: Oct 2015

Format: Paperback

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
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The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

It guides the reader by: helping to understand the type of information available and the requirements placed on the sample; advising on how to prepare the sample and the experiments that will generate the best-quality information and with what uncertainty. It covers the majority of practical aspects in acquiring and processing images and spectra (X-ray and energy loss).

Seeing on the nanoscale is a voyage of discovery, one that can start right here.
Imprint IOP Concise Physics
Pages 85
Dimensions 254 x 175
Date Published 30 Oct 2015
Publisher Morgan & Claypool Publishers
Subject/s Engineering measurement & calibration  
Dr Vlad Stolojan is a Lecturer in Nanomaterials Characterisation, working in the Advanced Technology Institute as part of the Nano-Electronics Centre. He is a member of the Institute of Physics and a fellow of the Royal Microscopical Society. Dr Stolojan is an alumnus of University of East Anglia (BSc Physics, 1996) and of the University of Cambridge (PhD Physics, 2001: "Nanochemistry of grain boundaries in iron"). He first joined the University of Surrey's School of Engineering in 2001 as an expert in electron microscopy and energy-loss spectroscopy, continuing as an RCUK Fellow with the University of Surrey's Electronic Engineering department, in Professor Ravi Silva's group. Dr Stolojan is an author of more than 80 peer-reviewed publications, a reviewer for a number of journals (Carbon, Applied Surface Science, Ultramicroscopy, etc) and a member of the Materials Engineering and Nanotechnology Panel of the National Council for Certification of University Degrees, Romania (CNATDCU).

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