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ISTFA 2011

Proceedings from the 37th International Symposium for Testing and Failure Analysis

ASM International (author)

ISBN: 9781615038268

Publication Date: Nov 2011

Format: Mixed media product

Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
£177.00

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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.

Pages 500
Date Published 30 Nov 2011
Publisher ASM International
Subject/s Mechanical engineering & materials  

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