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ISTFA 2010

Processing of The 36th International Symposium For Testing and Failure Analysis

, ASM International (author)

ISBN: 9781615030415

Publication Date: Jan 2011

Format: Mixed media product

Features research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included.
£98.50

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This volume features research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Pages 464
Date Published 30 Jan 2011
Publisher ASM International
Subject/s Mechanical engineering & materials  

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